An Efficient Test Data Compression Based on Iterative Xor Matrix Computation
نویسندگان
چکیده
The continuous increase in complexity of system on chip (SOC) design has resulted in higher test data volume. In this paper, we have proposed a new test data compression technique using an iterative XOR Matrix. This compression is a lossless compression technique that reduces the amount of test data and therefore reduction in test time. Experimental results on ISCAS 89 benchmark circuits are obtained. This demonstrates the effectiveness of the proposed technique in obtaining high compression ratio.
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تاریخ انتشار 2016